Recent developments in discontinuous metal thin film devices

Vacuum

Volumn 50, Issue 1-2, 1998, Pages 107-113

  Morris, James E ^a  

^a State University of New York at Binghamton   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC CONDUCTANCE; ELECTRIC CONTACTS; ELECTRON TUNNELING; ELECTROSTATICS; MATHEMATICAL MODELS; METALLIC FILMS; PERMITTIVITY; STRAIN GAGES;

CONTACT INJECTION MODEL; DISCONTINUOUS METAL THIN FILM DEVICES; ELECTRONIC CHARGE; SINGLE ELECTRON TRANSISTORS;

THIN FILM DEVICES;

EID: 0032058166     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0042-207x(98)00032-3     Document Type: Article

References (37)

1. Neugebauer, C. A., in Handbook of Thin Film Technology, ed. L. I. Maissel and R. Glang, McGraw-Hill, 1970.
2. Kazmerski, L. L. and Racine, D. M., Journal of Applied Physics, 1975, 46, 791.
3. Morris, J. E. and Coutts, T. J., Thin Solid Films, 1977, 47, 3-65.
4. Hill, R. M., Proceedings of the Royal Society, London, Series A, 1976, 309, 397.
5. Borziak, P., Diukov, V., Kostenko, A., Kulyupin, Yu. and Nepijko, S., Thin Solid Films, 1976, 36, 21.
6. Morris, J. E., Mello, A. and Adkins, C. J., in Physical Phenomena in Granular Materials, ed. D. Cody, T. H. Geballe and P. Sheng, Materials Research Society Proceedings, MRS Pittsburgh, 1990, 195, 181-186.
7. Morris, J. E., Thin Solid Films, 1990, 193/194, 110-116.
8. Morris, J. E. and Wu, F., in Proceedings of 10th International Conference on Thin Films, Salamanca, Sept., 1996 ; Thin Solid Films, 1997, in press.
9. Morris, J. E. and Wu, F., in Proceedings of 10th International Conference on Thin Films, Salamanca, Sept., 1996 ; Thin Solid Films, 1997, in press.
10. Leaver, K. D., J. Phys. C, 1977, 10, 249.
11. Parker, R. L. and Krinsky, A., Journal of Applied Physics, 1963, 34, 2000.
12. Boiko, B. T., Palatnik, L. S., Kopach, V. P. and Melent'tev, S. B., Soviet Physics - Solid State, 1972, 14, 1090.
13. Morris, J. E., Thin Solid Films, 1972, 11, 259.
14. Morris, J. E., Vacuum, 1972, 22, 153.
15. Andersson, T., Journal of Physics D : Applied Physics, 1976, 9, 973-985.
16. Morris, J. E., Thin Solid Films, 1975, 28, L21-L23.
17. Morris, J. E., Thin Solid Films, 1970, 5, 339-353.
18. Morris, J. E. and Wu, F., Thin Solid Films, 1994, 246, 17-23.
19. Morris, J. E., Kiesow, A., Hong, M. and Wu, F., Proc. 5th Int. Workshop Elec. Props. Metal/Non-Metal Microsyst., Polanica, 1995 ; Int. J. Electronics, 1996, 81(4), 441-447.
20. Morris, J. E., Kiesow, A., Hong, M. and Wu, F., Proc. 5th Int. Workshop Elec. Props. Metal/Non-Metal Microsyst., Polanica, 1995 ; Int. J. Electronics, 1996, 81(4), 441-447.
21. Broitman, E. and Zimmerman, R., 10th International Conference on Thin Films, Salamanca, Sept., 1996.
22. Pagnia, H., Invited Review, In Proc. 5th Int. Workshop Elec. Props. Metal/Non-Metal Microsyst., Polanica, 1995.
23. Morris, J. E., Metallography, 1972, 5, 41-58.
24. Mueller, F., Hietschold, M. and Morris, J. E., ZfM, Technische Universitat Chemnitz-Zwickau, 1996.
25. Grabert, H. and Devoret, M. H., eds, Single Charge Tunneling: Coulomb Blockade Phenomena in Nanostructures, NATO ASI Series B Physics, Vol. 294, Plenum, 1992.
26. Averin, D. V. and Likharev, K. K., J. Low Temp. Physics, 1986, 62, 354.
27. Tucker, J. R., J. Appl. Phys., 1992, 72, 4399.
28. Ferry, D. K., Barker, J. B. and Jacoboni, C., eds, Granular Nano-electronics, Plenum, 1991.
29. Ahmed, H. and Nakazato, K., Microelectronic Engineering, 1996, 32, 297.
30. Weitzenkamp, L. A. and Bashara, L. M., Transactions Metallurgical Society AIME, 1966, 236, 351.
31. Morris, J. E., Thin Solid Films, 1972, 11, 81-89.
32. Matsumoto, K., Proc. IEEE, 1997, 85(4), 612-628.
33. Servat, J., Gorastiza, P., Sanz, F., Perez-Murano, F., Barniol, N., Abagal, G. and Aymerich, X., J. Vac. Sci. Technol A., 1996, 14(3), 1208-1212.
34. Perez-Murano, F., Abagal, G., Barniol, N., Aymerich, X., Servat, J., Gorastiza, P. and Sanz, F., J. Appl. Physics, 1995, 78, 6797-6801.
35. Nakazato, K., Blaikie, R. J., Cleaver, J. R. A. and Ahmed, H., Electronics Lett., 1993, 29(4), 384.
36. Rosner, W., Hofmann, F., Vogelsang, T. and Risch, L., Microelectronic Engineering, 1995, 27, 55-58.
37. Yano, K., Ishii, T., Hashimoto, T., Kobayashi, T., Marai, F. and Seki, K., IEEE Trans. Electron Devices, 1994, 41, 1628.