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Volumn 17, Issue 4, 1998, Pages 357-366

A hybrid methodology for switching activities estimation

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; CORRELATION METHODS; DECISION THEORY; MATHEMATICAL MODELS; PROBABILITY; SWITCHING THEORY;

EID: 0032044923     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/43.703825     Document Type: Article
Times cited : (3)

References (16)
  • 2
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    • vol. 1, pp. 63-71, Mar. 1993.
    • "A Monte Carlo approach for power estimation," IEEE Trans. VLSI Syst., vol. 1, pp. 63-71, Mar. 1993.
    • IEEE Trans. VLSI Syst.
  • 8
    • 30244538410 scopus 로고    scopus 로고
    • "Power dissipation analysis of CMOS VLSI circuits by means of switch-level simulation," in
    • 1990, pp. 61-64.
    • C. M. Huizer, "Power dissipation analysis of CMOS VLSI circuits by means of switch-level simulation," in IEEE European Solid State Circuits Conf., 1990, pp. 61-64.
    • IEEE European Solid State Circuits Conf.
    • Huizer, C.M.1
  • 10
    • 0026175520 scopus 로고    scopus 로고
    • "Transition density, a stochastic measure of activity in digital circuits," in
    • 1991, pp. 644-649.
    • F. N. Najm, "Transition density, a stochastic measure of activity in digital circuits," in Proc. ACM/IEEE Design Automation Conf., June 1991, pp. 644-649.
    • Proc. ACM/IEEE Design Automation Conf., June
    • Najm, F.N.1
  • 12
    • 0022250468 scopus 로고    scopus 로고
    • "Predict: Probabilistic estimation of digital circuit testability," in
    • 1985, pp. 220-225.
    • S. C. Seth, L. Pan, and V. D. Agrawal, "Predict: probabilistic estimation of digital circuit testability," in Proc. Fault-Tolerant Computing Symp., 1985, pp. 220-225.
    • Proc. Fault-Tolerant Computing Symp.
    • Seth, S.C.1    Pan, L.2    Agrawal, V.D.3
  • 13
    • 0022614681 scopus 로고    scopus 로고
    • "An exact analysis for efficient computation of random pattern testability in combinational circuits," in
    • 1986, pp. 318-323.
    • S. C. Seth, B. B. Bhattacharya, and V. D. Agrawal, "An exact analysis for efficient computation of random pattern testability in combinational circuits," in Proc. Fault-Tolerant Computing Symp., 1986, pp. 318-323.
    • Proc. Fault-Tolerant Computing Symp.
    • Seth, S.C.1    Bhattacharya, B.B.2    Agrawal, V.D.3
  • 16
    • 0028573885 scopus 로고    scopus 로고
    • "Statistical estimation of the switching activity in digital circuits," in
    • 1994, pp. 728-733.
    • M. Xakellis and F. Najm, "Statistical estimation of the switching activity in digital circuits," in Proc. ACM/IEEE Design Automation Conf., June 1994, pp. 728-733.
    • Proc. ACM/IEEE Design Automation Conf., June
    • Xakellis, M.1    Najm, F.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.