EXACT ANALYSIS FOR EFFICIENT COMPUTATION OF RANDOM-PATTERN TESTABILITY IN COMBINATIONAL CIRCUITS.

Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)

Volumn , Issue , 1986, Pages 318-323

  Seth, Sharad C ^a   Bhattacharya, Bhargab B ^a   Agrawal, Vishwani D ^a  

^a UNIVERSITY OF NEBRASKA LINCOLN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SYSTEMS, DIGITAL - FAULT TOLERANT CAPABILITY; MATHEMATICAL TECHNIQUES - GRAPH THEORY; PROBABILITY;

OBSERVABILITY COMPUTATION; RANDOM-PATTERN TESTABILITY; SUPERGATE STRUCTURE;

LOGIC CIRCUITS, COMBINATORIAL;

EID: 0022614681     PISSN: 07313071     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)