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Volumn 72, Issue 13, 1998, Pages 1590-1592

Ballistic-electron-emission microscopy and spectroscopy of metal/GaN interfaces

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC VARIABLES MEASUREMENT; ELECTRON SPECTROSCOPY; GOLD; INTERFACES (MATERIALS); METALLORGANIC CHEMICAL VAPOR DEPOSITION; SCANNING TUNNELING MICROSCOPY;

EID: 0032025419     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121124     Document Type: Article
Times cited : (3)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.