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Volumn 72, Issue 13, 1998, Pages 1590-1592
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Ballistic-electron-emission microscopy and spectroscopy of metal/GaN interfaces
a a b b b b b |
Author keywords
[No Author keywords available]
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Indexed keywords
CURRENT VOLTAGE CHARACTERISTICS;
ELECTRIC VARIABLES MEASUREMENT;
ELECTRON SPECTROSCOPY;
GOLD;
INTERFACES (MATERIALS);
METALLORGANIC CHEMICAL VAPOR DEPOSITION;
SCANNING TUNNELING MICROSCOPY;
BALLISTIC ELECTRON EMISSION MICROSCOPY;
SCHOTTKY BARRIER HEIGHT;
SEMICONDUCTING GALLIUM COMPOUNDS;
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EID: 0032025419
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.121124 Document Type: Article |
Times cited : (3)
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References (13)
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