Defect-mediated kinetic roughening in low-temperature MBE growth of Si/Si (111)

Europhysics Letters

Volumn 41, Issue 5, 1998, Pages 519-524

  Gallas, B ^a   Berbezier, I ^a   Derrien, J ^a   Gandolfo, D ^b   Ruiz, J ^b   Zagrebnov, V A ^b  

^a CRMC2 CNRS Campus de Luminy   (France)

^b CENTRE DE PHYSIQUE THÉORIQUE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0032018732     PISSN: 02955075     EISSN: None     Source Type: Journal    
DOI: 10.1209/epl/i1998-00184-7     Document Type: Article

References (29)

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