X-ray photoelectron spectroscopy (XPS) used as a structural and chemical surface probe on aluminosilicate minerals

European Journal of Mineralogy

Volumn 10, Issue 3, 1998, Pages 423-437

  Biino, Giuseppe G ^a,b   Gröning, Pierangelo ^a  

^a UNIVERSITY OF FRIBOURG   (Switzerland)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINOSILICATES; ATOMS; CHEMICAL BONDS; CRYSTAL ATOMIC STRUCTURE; FELDSPAR; KINETIC ENERGY; KINETICS; PHOTOELECTRONS; PHOTONS; SCANNING TUNNELING MICROSCOPY; SILICON;

ALUMINOSILICATE MINERALS; CHEMICAL BONDING STATE; CHEMICAL COMPOSITIONS; CONTAMINATION LAYERS; ELEMENTAL COMPOSITIONS; PRESSED POWDER PELLETS; QUANTITATIVE INTERPRETATION; SURFACE ATMOSPHERE INTERACTION;

X RAY PHOTOELECTRON SPECTROSCOPY;

ALUMINOSILICATE MINERAL; SPECTROSCOPY; XPS;

EID: 0031697213     PISSN: 09351221     EISSN: None     Source Type: Journal    
DOI: 10.1127/ejm/10/3/0423     Document Type: Article

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