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Volumn 60, Issue 13, 1996, Pages 2413-2426

The calculation of STM images, STS spectra, and XPS peak shifts for galena: New tools for understanding mineral surface chemistry

Author keywords

[No Author keywords available]

Indexed keywords

GALENA; LEAD SULPHIDE; SCANNING TUNNELLING MICROSCOPY; SURFACE CHEMISTRY; X-RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0030455902     PISSN: 00167037     EISSN: None     Source Type: Journal    
DOI: 10.1016/0016-7037(96)00094-4     Document Type: Article
Times cited : (85)

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