Surface analysis by SNMS: Femtosecond laser postionization of sputtered and laser desorbed atoms

Surface and Interface Analysis

Volumn 24, Issue 6, 1996, Pages 363-370

  Nicolussi, Günther K ^a,d   Pellin, Michael J ^a   Lykke, Keith R ^a   Trevor, Jennifer L ^a,b   Mencer, Donald E ^c   Davis, Andrew M ^d  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

^c AURORA UNIVERSITY   (United States)

^d UNIVERSITY OF CHICAGO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; DESORPTION; ESTIMATION; EXCIMER LASERS; GAS LASERS; LASER APPLICATIONS; LASER PULSES; METALS; PHOTOIONIZATION; SECONDARY ION MASS SPECTROMETRY; SPUTTERING; SURFACE TREATMENT;

ION SPUTTERING; LASER DESORPTION; LASER RADIATION; NONSELECTIVE PHOTOIONIZATION; SECONDARY NEUTRAL ATOMS; SECONDARY NEUTRAL MASS SPECTROMETRY; SURFACE ANALYSIS; SURFACE EROSION; TIME OF FLIGHT MASS SPECTROMETRY;

SURFACES;

EID: 0030166557     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199606)24:6<363::AID-SIA129>3.0.CO;2-U     Document Type: Article

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