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Volumn 130, Issue 1-4, 1997, Pages 1-8

The nuclear microprobe: A unique instrument

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DIAMONDS; INTEGRATED CIRCUIT MANUFACTURE; ION BEAMS; ION IMPLANTATION; MICROMACHINING; PROBES; RADIATION EFFECTS; X RAY ANALYSIS;

EID: 0031549036     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(97)00164-X     Document Type: Article
Times cited : (23)

References (20)
  • 15
    • 0026360422 scopus 로고
    • Proc. 7th Oxford Conf. on Microscopy of Semiconducting Materials, Section 2
    • M.B.H. Breese, F. Watt, G.W. Grime and P.J.C. King, Proc. 7th Oxford Conf. on Microscopy of Semiconducting Materials, Inst. Phys. Conf. Ser. 117, Section 2 (1991) p. 101.
    • (1991) Inst. Phys. Conf. Ser. , vol.117 , pp. 101
    • Breese, M.B.H.1    Watt, F.2    Grime, G.W.3    King, P.J.C.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.