|
Volumn 130, Issue 1-4, 1997, Pages 1-8
|
The nuclear microprobe: A unique instrument
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ANNEALING;
DIAMONDS;
INTEGRATED CIRCUIT MANUFACTURE;
ION BEAMS;
ION IMPLANTATION;
MICROMACHINING;
PROBES;
RADIATION EFFECTS;
X RAY ANALYSIS;
NUCLEAR MICROPROBES;
PARTICLE INDUCED X RAY EMISSION;
NUCLEAR INSTRUMENTATION;
|
EID: 0031549036
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(97)00164-X Document Type: Article |
Times cited : (23)
|
References (20)
|