Study of physical and chemical inhomogeneities in semiconducting and insulating materials by a combined use of micro-PIXE and micro-IBIC

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 109-110, Issue , 1996, Pages 555-562

  Manfredotti, C ^b   Fizzotti, F ^b   Vittone, E ^a   Boero, M ^c   Polesello, P ^a   Galassini, S ^d   Jaksic, M ^e   Fazinic, S ^e   Bogdanovic, I ^e  

^a UNIVERSITY OF TURIN   (Italy)

^b SEZIONE DI TORINO   (Italy)

^c INFM   (Italy)

^d UNIVERSITY OF VERONA   (Italy)

^e RUDER BO KOVI INSTITUTE   (Croatia)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; CRYSTAL IMPURITIES; ELECTRIC FIELD MEASUREMENT; ELECTRON TRANSPORT PROPERTIES; ION BEAMS; PARTICLE DETECTORS; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTING DIAMONDS; SEMICONDUCTING SILICON; SINGLE CRYSTALS;

CARRIER TRAPPING TIMES; CHEMICAL IMPURITIES DISTRIBUTION; ELECTRIC FIELD DISTRIBUTION; ION BEAM INDUCED CURRENT (IBIC); PARTICLE INDUCED X RAY EMISSION (PIXE);

X RAY ANALYSIS;

EID: 4243845992     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(95)00968-X     Document Type: Article

References (5)

1. C. Manfredotti, F. Fizzotti, M. Boero, E. Vittone, P. Polesello, S. Galassini, M. Jaksic, S. Fazinic and I. Bogdanovic, Nucl. Instr. and Meth. B 100 (1995) 133.
2. C. Manfredotti, F. Fizzotti, E. Vittone, S. Bistolfi, M. Boero and P. Polesello, Nucl. Instr. and Meth. B 93 (1994) 516.
3. M. Hage-Ali, M.C. Busch, J.M. Koebel and P. Siffert, Proc. SPIE Conf., San Diego, CA (1994) in press.
4. C. Manfredotti, M. Boero, C. Cassiago, P. Polesello, E. Vittone, L. Duò and E. Arnaboldi, to be published in Adv. Mater. Res.
5. W.D. Davis, Phys. Rev. 114 (1959) 1006.