Mobility measurement in current filaments

Acta Technica CSAV (Ceskoslovensk Akademie Ved)

Volumn 42, Issue 6, 1997, Pages 705-710

  Novák, Vít ^a   Hirschinger, Jürgen ^b   Prettl, Wilhelm ^b   Niedernostheide, Franz Josef ^c   Cukr, Miroslav ^d   Oswald, Jiří ^d  

^a INSTITUTE OF MATHEMATICS   (Czech Republic)

^b UNIVERSITY OF REGENSBURG   (Germany)

^c UNIVERSITY OF MÜNSTER   (Germany)

^d INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

Current filament; Electron mobility; Hall angle; Hall factor

Indexed keywords

ELECTRIC CURRENTS; ELECTRON TRANSPORT PROPERTIES; GALVANOMAGNETIC EFFECTS; HALL EFFECT;

CURRENT FILAMENTS; ELECTRON MOBILITY MEASUREMENT;

SEMICONDUCTING GALLIUM ARSENIDE;

EID: 0031382406     PISSN: 00017043     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (18)

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