Simulation of current filaments in semiconductors with point contacts and Corbino disks

Acta Technica CSAV (Ceskoslovensk Akademie Ved)

Volumn 42, Issue 6, 1997, Pages 669-684

  Schwarz, Georg ^a   Schöll, Eckehard ^a  

^a TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

Corbino disk; Current filaments; High field transport; Impact ionization; Semiconductors

Indexed keywords

COMPUTER SIMULATION; CRYSTAL IMPURITIES; ELECTRIC BREAKDOWN OF SOLIDS; ELECTRIC CURRENTS; ELECTRON SCATTERING; ELECTRON TRANSPORT PROPERTIES; HOT CARRIERS; IONIZATION OF SOLIDS; LOW TEMPERATURE EFFECTS; MONTE CARLO METHODS; POINT CONTACTS; SEMICONDUCTOR DEVICE MODELS;

CORBINO DISKS; CURRENT FILAMENTS; IMPACT IONIZATION;

SEMICONDUCTOR MATERIALS;

EID: 0031362745     PISSN: 00017043     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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