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Volumn 36, Issue 12 SUPPL. B, 1997, Pages 7625-7631

Dissolution inhibitors for 193-nm chemically amplified resists

Author keywords

Alicyclic resist; ArF excimer laser; Chemically amplified resist; Dissolution inhibitor; MO calculation; Naphthalene

Indexed keywords

ADHESION; DISSOLUTION; DRY ETCHING; EXCIMER LASERS; MOLECULAR STRUCTURE; NAPHTHALENE;

EID: 0031345569     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.36.7625     Document Type: Article
Times cited : (5)

References (15)
  • 9
    • 0003901747 scopus 로고
    • Fujitsu Ltd., Tokyo, Japan
    • MOPAC93: J. J. P. Stewart, Fujitsu Ltd., Tokyo, Japan (1993).
    • (1993) MOPAC93
    • Stewart, J.J.P.1
  • 11
    • 5244362495 scopus 로고
    • Kodansha Scientific, Tokyo, [in Japanese]
    • MD Calculation: For example, Molecular Dynamics and Monte Cairo method (Kodansha Scientific, Tokyo, 1994) [in Japanese].
    • (1994) Molecular Dynamics and Monte Cairo Method
  • 13
    • 5244256688 scopus 로고
    • J. J. P. Stewart, Fujitsu Ltd., Tokyo, Japan
    • COSMO Method: Manual of MOPAC 93; J. J. P. Stewart, Fujitsu Ltd., Tokyo, Japan (1993).
    • (1993) Manual of MOPAC 93


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.