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Volumn 36, Issue 12 SUPPL. B, 1997, Pages 7625-7631
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Dissolution inhibitors for 193-nm chemically amplified resists
a a a a a a |
Author keywords
Alicyclic resist; ArF excimer laser; Chemically amplified resist; Dissolution inhibitor; MO calculation; Naphthalene
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Indexed keywords
ADHESION;
DISSOLUTION;
DRY ETCHING;
EXCIMER LASERS;
MOLECULAR STRUCTURE;
NAPHTHALENE;
ALICYCLIC RESISTS;
CHEMICALLY AMPLIFIED RESISTS;
PHOTORESISTS;
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EID: 0031345569
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.36.7625 Document Type: Article |
Times cited : (5)
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References (15)
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