메뉴 건너뛰기




Volumn 358, Issue 1-2, 1997, Pages 304-307

Characterization of Laser-Arc deposited multilayer systems by means of AES, Factor Analysis and XPS

Author keywords

[No Author keywords available]

Indexed keywords


EID: 6244240498     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s002160050413     Document Type: Article
Times cited : (2)

References (30)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.