Quantitative surface characterization using X-ray photoelectron spectroscopy

Fresenius' Journal of Analytical Chemistry

Volumn 355, Issue 3-4, 1996, Pages 209-215

  Hercules, David M ^a  

^a VANDERBILT UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002697425     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s0021663550209     Document Type: Article

References (9)

1. Hercules DM, Houalla M, Proctor A, Fiedor JN (1993) Anal Chim Acta. 283:42
2. Hercules DM, Proctor A, Houalla M (1994) Accts Chem Res 27: 387
3. Quincy RB, Houalla M, Proctor A, Hercules DM (1990) J Phys Chem 94:1520
4. Scierka SJ, Proctor A, Houalla M, Fiedor JN, Hercules DM (1993) Surf Interface Anal 20:901
5. Fiedor JN, Proctor A, Houalla M, Hercules DM (1995) Surf Interface Anal 23:204
6. Fiedor JN, Proctor A, Houalla M, Hercules DM (1993) Surf Interface Anal 20:1
7. Jansson PA (1984) Deconvolution. Academic Press, Orlando, FL
8. Sprenger D, Anderson O (1991) Fresenius J Anal Chem 341:116
9. Yamada M, Yasumaru J, Houalla M, Hercules DM (1991) J Phys Chem 95:7037