New optical depth-profiling technique by use of the multiple-frequency approach with single ATR FT-IR spectrum: Theoretical development

Applied Spectroscopy

Volumn 51, Issue 10, 1997, Pages 1488-1495

  Ekgasit, Sanong ^a   Ishida, Hatsuo ^a  

^a CASE WESTERN RESERVE UNIVERSITY   (United States)

Author keywords

ATR FT IR; Depth profiling; Linear least squares fitting; Multiple frequency approach; Nonlinear fitting

Indexed keywords

CALCULATIONS; LAPLACE TRANSFORMS; POLARIZATION; REFRACTIVE INDEX; SIGNAL TO NOISE RATIO;

LINEAR LEAST SQUARES FITTING; MULTIPLE FREQUENCY APPROACH; NONLINEAR FITTING; OPTICAL DEPTH PROFILING; OPTICAL THEORY;

FOURIER TRANSFORM INFRARED SPECTROSCOPY;

EID: 0031249376     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702971939271     Document Type: Article

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