Atomic force microscopy and photoluminescence study of Ge layers and self-organized Ge quantum dots on Si(100)

Applied Physics Letters

Volumn 68, Issue 21, 1996, Pages 2982-2984

  Palange, E ^a   Capellini, G ^b   Di Gaspare, L ^b   Evangelisti, F ^b  

^a UNIVERSITÀ DI ROMA LA SAPIENZA   (Italy)

^b ROMA TRE UNIVERSITY   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001520373     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116669     Document Type: Article

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