CAPACITANCE TRANSIENT SPECTROSCOPY.

Annual Review of Materials Science

Volumn 7, Issue , 1977, Pages 377-448

  Miller, G L ^a   Lang, D V ^a   Kimerling, L C ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS - DEFECTS; ELECTRIC MEASUREMENTS - CAPACITANCE; SPECTROSCOPY;

SEMICONDUCTOR MATERIALS;

EID: 0017631852     PISSN: 00846600     EISSN: None     Source Type: Journal    
DOI: 10.1146/annurev.ms.07.080177.002113     Document Type: Article

References (86)