SCOPUS 정보 검색 플랫폼

Thin Solid Films

Volumn 273, Issue 1-2, 1996, Pages 128-131

Nanoscopic analysis of the conduction mechanism in organic positive temperature coefficient composite materials

(6) Matsushige, Kazumi a Kobayashi, Kei a Iwami, Norimasa a Horiuchi, Toshihisa a Shitamori, Eiichi b Itoi, Masaaki b

a KYOTO UNIVERSITY (Japan)

b IDEMITSU KOSAN CO LTD (Japan)

Author keywords

Atomic force microscopy; Carbon; Conductivity; Polymers

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON BLACK; COMPOSITE MATERIALS; COPOLYMERS; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENT MEASUREMENT; ELECTRIC INSULATING MATERIALS; NANOSTRUCTURED MATERIALS; SCANNING; THIN FILMS;

CONDUCTION MECHANISM; CURRENT MODE MEASUREMENT; NANOSCOPIC ANALYSIS; ORGANIC POSITIVE TEMPERATURE COEFFICIENT COMPOSITE MATERIALS; SCANNING PROBE MICROSCOPE;

ORGANIC COMPOUNDS;

EID: 0030079966 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/0040-6090(95)06804-X Document Type: Article

Times cited : (26)

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