Scanning tunneling microscopy studies and computer simulations of annealing of gold films

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 1, 1996, Pages 30-37

  Porath, D ^a   Millo, O ^a   Gersten, J I ^b  

^a HEBREW UNIVERSITY OF JERUSALEM   (Israel)

^b CITY COLLEGE OF NEW YORK   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4243082316     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.588467     Document Type: Article

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