Polarization effects in reflection scanning near field optical microscopy

Optics Communications

Volumn 136, Issue 3-4, 1997, Pages 213-218

  Xiao, Mufei ^a,b,c  

^a UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

^b Institute of Physics UNAM   (United States)

^c NANCHANG HANGKONG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EFFECTS; IMAGE QUALITY; LIGHT POLARIZATION; MICROSCOPES; OPTICAL RESOLVING POWER;

INCIDENT LIGHT; PROBE TIP; REFLECTION SCANNING NEAR FIELD OPTICAL MICROSCOPY;

OPTICAL MICROSCOPY;

EID: 0031102989     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-4018(96)00686-4     Document Type: Article

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