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Volumn 120, Issue 1-4, 1996, Pages 151-155

Ion beam synthesis and recrystallization of amorphous SiGe/SiC structures

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; ANNEALING; AUGER ELECTRON SPECTROSCOPY; CRYSTALLIZATION; INFRARED SPECTROSCOPY; ION BOMBARDMENT; MICROSCOPIC EXAMINATION; RAMAN SPECTROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DOPING; SILICON CARBIDE; SILICON COMPOUNDS;

EID: 0030566478     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(96)00498-3     Document Type: Article
Times cited : (3)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.