LIMSoft: Automated tool for sensitivity analysis and test vector generation

IEE Proceedings: Circuits, Devices and Systems

Volumn 143, Issue 6, 1996, Pages 386-392

  Saab, K ^a   Marche, D ^a   Hamida, N B ^a   Kaminska, B ^a  

^a ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

Author keywords

Sensitivity analysis; Test rector generation

Indexed keywords

COMPUTER AIDED NETWORK ANALYSIS; COMPUTER SIMULATION; SENSITIVITY ANALYSIS; TRANSIENTS;

SOFTWARE PACKAGE LIMSOFT; TEST VECTOR GENERATION;

INTEGRATED CIRCUIT TESTING;

EID: 0030420001     PISSN: 13502409     EISSN: None     Source Type: Journal    
DOI: 10.1049/ip-cds:19960934     Document Type: Article

References (17)

1. SLAMANI, M., and KAMINSKA, B.: 'Soft large deviation and hard fault multifrequency analysis in analog circuits', IEEE Des. Test Coniptit., 1995, 12, (2), pp. 70-80
2. DIRECTOR, S.W., and ROHRER, R.A.: 'Automated network design -the frequency domain case", IEEE Trans. Circuit Theory, 1969, CT-16, (3), pp. 330-337
3. SLAMANI, M., and KAMINSKA, B.: 'Multifrequncy testability analysis for analog circuits', IEEE Trans. Circuits Syst. II. 1996, 43, (2), pp. 134-139
4. HAMIDA, N.B., and KAMINSKA, B.: 'Multiple fault analog circuit testing by sensitivity analysis', J. Electron. Test., 1993, 4, (4), pp. 331-343
5. SLAMANI, M., and KAMINSKA, B.: 'Analog circuit fault diagnosis based on sensitivity computation and functional testing', IEEE Des. Test Comput., 1992, 9, (1), pp. 30-39
6. SLAMANI, M., and KAMINSKA, B.: 'An integrated approach for analog circuit testing with a minimum number of detected parameters'. IEEE international Test conference, Washington DC, October 1994, pp. 631-640
7. SLAMANI, M., and KAMINSKA, B.: 'Multifrequency testability analysis for analog circuits'. 12th IEEE VLSI Test symposium, Cherry Hill, 25-28 April 1994, pp. 54-59
8. HAMIDA, N.B., and KAMINSKA, B.: 'Analog circuit testing based on sensitivity computation'. IEEE international Test conference, Baltimore, October 1993, pp. 652-661
9. SLAMANI, M., and KAMINSKA, B.: Testing analog circuits by sensitivity computation'. European Design automation conference, EDAC'92, Bruxelles, March 1992, pp. 563-569
10. HAMIDA, N.B., SAAB, K., MARCHE, D., KAMINSKA, B., and QUESNEL, G.: 'LIMSoft: automated tool for design and test integration of analog circuits'. IEEE international Test conference, Washington DC, October 1996
11. 'HSPICE user's manual, version H92'. Meta-Software Inc, 1992
12. CHUA, L.O., and LIN, P.M.: 'Computer-aided analysis of electronic circuits' (Prentice-Hall, Enalewood Cliffs, New Jersey, 1975
13. WONG, WAV., WINTON, R.S., and LIOU, J.J.: 'Integrated-circuit sensitivity simulation using SPICE', IEE Proc. G, 1991, 138, (1)
14. DIRECTOR, S.W., and ROHRER, R.A.: 'The generalized adjoint network and network sensitivities', IEEE Trans. Circuit Theory, 1969, CT-16, (3), pp. 318-323
15. CHOJEAN, J., and IZYDORCKY, J.: 'The time domain sensitivity computation using SPICE2. The linear network case'. Proceedings of international AMSE conference Signal & system, Cetinje, YugosIavia,3-5 September 1990, Vol. 3, pp. 113-123
16. SETH, A.K.: 'Comments on time domain network sensitivity using the adjoint network concept', IEEE Trans. Circuit Theory, 1972, (4), pp. 367-370
17. ANDERSSON, M., and TASKIMEN, M.: 'APLAC user's manual version 6.2'. Helsinki University of Technology, Circuit Theory Laboratory and Nokia Corporation, Research Centre, March 1994