Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing

IEEE Design and Test of Computers

Volumn 9, Issue 1, 1992, Pages 30-39

  Siamani, Mustapha ^a   Kaminsi, Bozena ^a  

^a ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER PROGRAMMING - ALGORITHMS;

ANALOG INTEGRATED CIRCUITS; FAULT DIAGNOSIS; FUNCTIONAL TESTING; SENSITIVITY CALCULATION;

INTEGRATED CIRCUITS;

EID: 0026839606     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/54.124515     Document Type: Article

References (20)

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