Multifrequency testability analysis for analog circuits

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1994, Pages 54-59

  Slamani, Mustapha ^a   Kaminska, Bozena ^a  

^a ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FAULT LOCATION; ELECTRIC NETWORK ANALYSIS; ERROR DETECTION; LINEAR INTEGRATED CIRCUITS; MATHEMATICAL MODELS; OBSERVABILITY;

FAULT DOMINANCE; FAULT EQUIVALENCE; FAULT MASKING; MULTIFREQUENCY TESTABILITY ANALYSIS; NONOBSERVABLE FAULTS;

INTEGRATED CIRCUIT TESTING;

EID: 0028734143     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)