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Volumn , Issue , 1996, Pages 3-10

SOI: Materials to Systems

Author keywords

[No Author keywords available]

Indexed keywords

COMMERCE; SILICON ON INSULATOR TECHNOLOGY; SILICON WAFERS; SYSTEM-ON-CHIP; BONDING; COST EFFECTIVENESS; HYDROGEN; ION IMPLANTATION; PRODUCTION ENGINEERING; QUALITY ASSURANCE; RANDOM ACCESS STORAGE; ULSI CIRCUITS;

EID: 0030398686     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.1996.553028     Document Type: Conference Paper
Times cited : (55)

References (22)
  • 1
    • 85127402430 scopus 로고    scopus 로고
    • 16Mb DRAM/SOI technologies for sub-LV operation
    • T.Oashi, et al, "16Mb DRAM/SOI Technologies for Sub-lV Operation " Submitted to IEDM 1996
    • (1996) Submitted to IEDM
    • Oashi, T.1
  • 3
    • 85127433260 scopus 로고
    • German Patent inarch 2
    • German Patent 439,457 inarch 2,1934 Oscar Heil.
    • (1934) Oscar Heil
  • 13
    • 0030421137 scopus 로고    scopus 로고
    • Improvement of leakage current related yield of SOI MOSFET's using Nitrogen ion implantation to the source and drain regions
    • Y.Yamaguchi et al, "Improvement of leakage current related yield of SOI MOSFET's using Nitrogen ion implantation to the source and drain regions" submitted to I E E E SOI Conference October 1996.
    • (1996) I E E E SOI Conference October
    • Yamaguchi, Y.1
  • 20
    • 0030397240 scopus 로고    scopus 로고
    • A novel pattern transfer Process for Bonded SOI Gigabit DRAMs
    • al October
    • B.H.Lee, and al T.Barge et al A novel pattern transfer Process for Bonded SOI Gigabit DRAMs, submitted to IEEE SOI conference October 1996.
    • (1996) IEEE SOI Conference
    • Lee, B.H.1    Barge, T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.