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Volumn 39, Issue 10, 1992, Pages 2235-2239

CW Measurement of HBT Thermal Resistance

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENT MEASUREMENT; HETEROJUNCTIONS; THERMAL EFFECTS; VOLTAGE MEASUREMENT;

EID: 0026941833     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.158793     Document Type: Article
Times cited : (166)

References (6)
  • 2
    • 0001974214 scopus 로고
    • Voltage feedback and thermal resistance in junction transistors
    • June
    • J. J. Sparkes, “Voltage feedback and thermal resistance in junction transistors,” Proc. IRE, vol. 46, 1305–1306, June 1958.
    • (1958) Proc. IRE , vol.46 , pp. 1305-1306
    • Sparkes, J.J.1
  • 3
    • 0026108045 scopus 로고
    • Emitter ballasting resistor design for, and current handling capability of AlGaAs/GaAs power heterojunction bipolar transistors
    • G. B. Gao, M. S. Unlu, H. Morkoc, and D. L. Blackburn, “Emitter ballasting resistor design for, and current handling capability of AlGaAs/GaAs power heterojunction bipolar transistors,” IEEE Trans. Electron Devices, vol. 38, no. 2, pp. 185–196, Feb. 1991.
    • (1991) IEEE Trans. Electron Devices , vol.38 , Issue.2 , pp. 185-196
    • Gao, G.B.1    Unlu, M.S.2    Morkoc, H.3    Blackburn, D.L.4
  • 4
    • 84967351598 scopus 로고    scopus 로고
    • Experiments on heat sinking of semiconductor devices
    • W. Fallmann, H. L. Hartnagel, and P. C. Mathur, “Experiments on heat sinking of semiconductor devices,” Electron. Lett., vol. 7, pp. 512–513, 1971.
    • , vol.Electron. Lett , pp. 512-513
    • Fallmann, W.1    Hartnagel, H.L.2    Mathur, P.C.3
  • 5
    • 0016496045 scopus 로고
    • Thermal dependence of heat sinks with temperature dependent conductivity
    • W. B. Joyce, “Thermal dependence of heat sinks with temperature dependent conductivity,” Solid-State Electron., vol. 18, pp. 321–322, 1975.
    • (1975) Solid-State Electron , vol.18 , pp. 321-322
    • Joyce, W.B.1
  • 6
    • 0007905164 scopus 로고
    • Measurement and prediction of operating temperatures for GaAs ICs
    • Dec.
    • D. H. Smith, A. Fraser, and J. O’Neil, “Measurement and prediction of operating temperatures for GaAs ICs,” in IEEE SEMITHERM 86 (Proc.), Dec. 1986, paper A.5.
    • (1986) IEEE SEMITHERM 86 (Proc.) , pp. A.5.
    • Smith, D.H.1    Fraser, A.2    O’Neil, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.