New erbium silicide superstructures: A study by high resolution electron microscopy

Physica Status Solidi (A) Applied Research

Volumn 158, Issue 1, 1996, Pages 107-116

  Frangis, N ^a,d   Van Tendeloo, G ^a   Van Landuyt, J ^a   Kaltsas, G ^b   Travlos, A ^c   Nassiopoulos, A G ^b  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b INSTITUTE OF MICROELECTRONICS   (Greece)

^c INSTITUTE OF MATERIALS SCIENCE   (Greece)

^d ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COMPOSITION; CRYSTAL STRUCTURE; DEPOSITION; ELECTRON MICROSCOPY; ERBIUM; ERBIUM COMPOUNDS; SILICON; SUBSTRATES;

ERBIUM SILICIDE; SINGLE DEPOSITION; SUPERSTRUCTURES;

THIN FILMS;

EID: 0030283612     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssa.2211580114     Document Type: Article

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