Subpicosecond imaging system based on electrooptic effect

IEEE Journal on Selected Topics in Quantum Electronics

Volumn 2, Issue 3, 1996, Pages 729-737

  Jacobs Perkins, Doug ^b,c,d   Currie, Marc ^a,b   Wang, Chia Chi ^b   Williams, Carlo A ^a,b   Donaldson, William R ^a,b   Sobolewski, Roman ^b   Hsiang, Thomas Y ^b  

^a IEEE

^b UNIVERSITY OF ROCHESTER   (United States)

^c UNIVERSITY OF WISCONSIN MADISON   (United States)

^d UNIVERSITY OF ROCHESTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD MEASUREMENT; ELECTROOPTICAL EFFECTS; PROBES; VOLTAGE DISTRIBUTION MEASUREMENT;

ELECTROOPTIC SAMPLING;

IMAGING SYSTEMS;

EID: 0030230970     PISSN: 1077260X     EISSN: None     Source Type: Journal    
DOI: 10.1109/2944.571774     Document Type: Article

References (19)

1. J. A. Valdmanis, G. Mourou, and C. W. Gabel, "Picosecond electro-optic sampling system," Appl. Phys. Lett., vol. 41, no. 3, pp. 211-212, 1982.
2. J. M. Wiesenfeld, "Electro-optic sampling of high-speed devices and integrated circuits," IBM J. Res. Develop., vol. 34, no. 2/3, pp. 141-161, 1990.
3. S. Alexandrou, R. Sobolewski, and T. Y. Hsiang, "Time-domain characterization of bent coplanar waveguides," IEEE J. Quantum. Electron., vol. 28, no. 10, pp. 2325-2332, 1992.
4. C.-C. Wang, S. Alexandrou, D. Jacobs-Perkins, and T. Y. Hsiang, "Comparison of the Picosecond characteristics of silicon-on-sapphire metal-semiconductor-metal photodiodes," Appl. Phys. Lett., vol. 64, no. 26, pp. 3578-3580, 1994.
5. C.-C. Wang, M. Currie, D. Jacobs-Perkins, M. J. Feldman, R. Sobolewski, and T. Y. Hsiang, "Optoelectronic generation and detection of single-flux-quantum pulses," Appl. Phys. Lett., vol. 66, no. 24, pp. 3325-3327, 1995.
6. 7-8 thin films," Appl. Phys. Lett., vol. 67, no. 2, pp. 285-287, 1995.
7. T. Nagatsuma, N. Shimizu, T. Waho, and M. Shinagawa, "Optoelectronic characterization of resonant tunneling diodes," in Ultrafast Electronics and Optoelectronics (1995 Tech. Dig. Ser). Washington, DC: Opt. Soc. Amer., vol. 13, 1995, pp. 61-63.
8. C.-C. Wang, M. Currie, R. Sobolewski, and T. Y. Hsiang, "Subpicosecond electrical pulse generation by edge illumination of silicon and indium phosphide photoconductive switches," Appl. Phys. Lett., vol. 67, no. 1, pp. 79-81, 1995.
9. W. R. Donaldson, L. Kingsley, M. Wiener, A. Kim, and R. Zeto, "Electro-optic imaging of the internal fields in a GaAs photoconductive switch," J. Appl. Phys., vol. 68, no. 12, pp. 6453-6457, 1990.
10. R. A. Falk, J. C. Adams, S. G. Ferrier, and C. D. Capps, "Dynamic optical probing of high-power photoconductors," in the Ninth IEEE Int. Pulsed Power Conf. (Dig. Tech. Pap.), K. R. Prestwich and W. L. Baker, Eds. New York: IEEE, 1993, vol. 1, pp. 88-91.
11. A. Zeng, M. K. Jackson, M. Van Hove, and W. De Raedt, "Electrooptic characterization of modulation-doped field-effect transistors with monolithically-integrated test fixtures," Opt. Quantum Electron., vol. 28, pp. 867-874, 1996.
12. J. Allam, N. De B. Baynes, J. R. A. Cleaver, K. Ogawa, T. Mishima, and I. Ohbu, "Monolithically-integrated optoelectronic circuit for ultrafast sampling of a dual-gate field-effect transistor," Opt. and Quantum Electron., vol. 28, pp. 875-896, 1996.
13. H. Takahashi, S. Aoshima, K. Wakamori, I. Hirano, and Y. Tsuchiya, "Highly sensitive real time electro-optic probing for long logic pattern analysis," IEICE Trans. Electron., vol. E78-C, no. 1, pp. 67-72, 1995.
14. T. Nagatsuma, "Electro-optic testing of ultrafast electronic and optoelectronic devices," in Ultrafast Electronics and Optoelectronics, (1995 Tech. Dig. Ser.). Washington, DC: Opt. Soc. Amer., vol. 13, 1995, pp. 46-48.
15. K. E. Meyer and G. A. Mourou, "Two dimensional E-field mapping with subpicosecond resolution," in Picosecond Electrons and Optoelectronics, G. A. Mourou, D. M. Bloom, and C. H. Lee, Eds. New York: Springer-Verlag, 1985, pp. 46-49.
16. W. Mertin, "Two-dimensional field mapping of monolithic microwave integrated circuits using electrooptic sampling," Opt. Quantum Electron., vol. 28, pp. 801-817, 1996.
17. A. Yariv and P. Yeh, Optical Waves in Crystals: Propagation and Control of Laser Radiation. New York: Wiley, 1984, pp. 220-245.
18. D. H. Austin and M. C. Nuss, "Electrooptic generation and detection of femtosecond electrical transients," IEEE J. Quantum Electron., vol. 24, pp. 184-197, 1988.
19. Area Array Image Sensor Products Data Book, Texas Instruments Incorporated, pp. 2-135-2-151, 1994.