Non-destructive characterization of materials by evanescent microwaves

Measurement Science and Technology

Volumn 4, Issue 5, 1993, Pages 583-590

  Tabib Azar, M ^a   Shoemaker, N S ^a   Harris, S ^a  

^a CASE WESTERN RESERVE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EVANESCENT FIELD MICROWAVE MICROSCOPY; EVANESCENT MICROWAVES;

ELECTRIC CONDUCTIVITY; GLASS; MICROSTRIP DEVICES; MICROWAVES; NONDESTRUCTIVE EXAMINATION; OPTICAL RESOLVING POWER; OPTICAL RESONATORS; PRINTED CIRCUIT BOARDS; PROBES; SEMICONDUCTING SILICON;

IMAGING TECHNIQUES;

EID: 0027589681     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/4/5/007     Document Type: Article

References (13)

1. Near-field optical-scanning microscopy