MEASUREMENT OF ALPHA PARTICLE RADIOACTIVITY IN IC DEVICE PACKAGES.

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1979, Pages 13-22

  Meieran, Eugene S ^a   Engel, Paul R ^a   May, T C ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

RADIOACTIVITY; RELIABILITY;

INTEGRATED CIRCUITS;

EID: 0018736444     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (33)