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Volumn , Issue , 1992, Pages 276-280
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Building-in reliability: Soft errors--A case study
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NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
ALPHA PARTICLES;
ELECTRONICS PACKAGING;
INTEGRATED CIRCUITS;
RELIABILITY;
SEMICONDUCTOR DEVICE MANUFACTURE;
DRAMS;
SOFT ERROR RATES;
RANDOM ACCESS STORAGE;
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EID: 0026834350
PISSN: 00999512
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/relphy.1992.187657 Document Type: Conference Paper |
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Times cited : (22)
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References (5)
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