Methodology for roughness measurement and contact analysis for optimization of interface roughness

IEEE Transactions on Magnetics

Volumn 32, Issue 3 PART 2, 1996, Pages 1819-1825

  Bhushan, Bharat ^a  

^a Ohio State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; DISTANCE MEASUREMENT; INTERFACES (MATERIALS); MAGNETIC FILMS; MAGNETIC HEADS; OPTIMIZATION; PLASTIC DEFORMATION; ROUGHNESS MEASUREMENT; STICTION; SURFACES; TRIBOLOGY;

CONTACT ANALYSIS; INTERFACE ROUGHNESS; LIQUID FILM THICKNESS; NANOASPERITIES;

MAGNETIC DISK STORAGE;

EID: 0030141923     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.492871     Document Type: Article

References (16)

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