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Volumn 190, Issue 1, 1995, Pages 89-109

Surface roughness analysis of glass-ceramic substrates and finished magnetic disks, and Ni-P coated Al-Mg and glass substrates

(2) Poon, Chin Y a Bhushan, Bharat a

a OHIO STATE UNIVERSITY (United States)

Author keywords

Instrument resolution; Magnetic disks; Roughness analysis; Roughness measurement; Sampling resolution; Scan size

Indexed keywords

ALUMINUM; ATOMIC FORCE MICROSCOPY; CERAMIC MATERIALS; GLASS; MAGNESIUM; MAGNETIC DISK STORAGE; SAMPLING; SURFACE ROUGHNESS; TRIBOLOGY;

GLASS CERAMIC SUBSTRATES; INSTRUMENT RESOLUTION; NON CONTACT OPTICAL PROFILER; PEAK TO MEAN MEASUREMENT; SAMPLING RESOLUTION; SCAN SIZE; STYLUS PROFILER;

SURFACE MEASUREMENT;

EID: 0029410066 PISSN: 00431648 EISSN: None Source Type: Journal
DOI: 10.1016/0043-1648(95)06764-7 Document Type: Article

Times cited : (43)

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