New probe for W-band on-wafer measurements

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 1993, Pages 1335-1338

  Joseph Liu, S M ^a   Boll, Gregory G ^a  

^a Electric Electronics Laboratory   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC VARIABLES MEASUREMENT; SIGNAL TO NOISE RATIO; TRANSISTORS; WSI CIRCUITS;

ACTIVE CIRCUITS; BUILT-IN BIAS TEE; MICROWAVE WAFER PROBING; ON WAFER MEASUREMENT; VECTOR AUTOMATIC NETWORK ANALYZER; W-BAND PROBE;

PROBES;

EID: 0027239139     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)