Circuit-internal characterization of MMICs using two-dimensional electro-optic field mapping in combination with microwave cad techniques

1994 24th European Microwave Conference, EUMA 1994

Volumn 2, Issue , 1994, Pages 1386-1391

  David, G ^a   Tempel, R ^b   Ising, A ^a   Kalayci, Y ^b   Wolff, L ^b,c   Jager D ^a  

^a FG Optoelektronik   (Germany)

^b IMST ^*  (Germany)

^c FG Allgemeine und Theoretische Elektrotechnik ^*  (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; ELECTRONIC EQUIPMENT TESTING; MICROWAVES; TIMING CIRCUITS;

DESIGN LAYOUT; ELECTRO-OPTIC MEASUREMENTS; INTERNAL PERFORMANCE; MEASUREMENT AND SIMULATION; MICROWAVE CADS; MICROWAVE SIGNALS; NONLINEAR BEHAVIOURS; SATURATION CONDITIONS;

MONOLITHIC MICROWAVE INTEGRATED CIRCUITS;

EID: 84897497938     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EUMA.1994.337409     Document Type: Conference Paper

References (10)

1. B.H. Kolner and D.M. Bloom, "Electrooptic sampling in GaAs integrated circuits", IEEE J. Quantum Electron., vol. QE-22, (1986), 79-93
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3. J.L. Freeman, D.M. Bloom, S.R. Jefferies, and B.A. Auld, "Accuracy of electro-optic measurements of coplanar waveguide transmission lines", Appi. Phys. Letti 53 (1988), 7-9
4. M.G. Li, E.A. Chauchard, CH. Lee, and H.-L.A. Hung: "Two-dimensional field mapping of GaAs microstrip circuit by electrooptic sensing", OSA Proc. Picosecond Electronics and Optoelectronics, March 13-15, 1991, Salt Lake City, USA, 54-58
5. W. Mertin, C. Böhm, L.J. Balk, and E. Kubalek: "Two-dimensional field mapping in MMIC-substrates by electro-optic sampling technique", 1992 IEEE MTT-S Int. Microwave Symp. Dig. 1992, vol. 3, 1443-1446
6. V. Radisic, D.R. Hjeleme, Z.B. Popovic, A.R. Mickelson, "Analysis and measurements of coplanar waveguide discontinuities", 1993 IEEE MTT-S Dig. Symp., June 1-6, 1993, Atlanta, USA, 951-954
7. G. David, S. Redlich, W. Mertin, E. Kubalek, and D. Jäger, "Two-dimensional field mapping in coplanar MMIC-components using direct electro-optic probing", Proc. 4th EOBT, September 1-3, (1993), Zihich, Switzerland, 8-11-8-14
8. G. David, S. Redlich, W. Mertin, R.M. Bertenburg, S. Koßlowski, F.J. Tegude, and D. Jäger, "Two-dimensional direct electi-o-optic field mapping in a monolithic integrated GaAs amplifier", Proc. 23rd EuMC, September 6-9, 1993, Madrid, Spain, 497-499
9. The MESFETs are produced by the Ferdinand-Braun-Institut für Höchstfrequenztechnik BerUn, Germany
10. P. Pogazki, R. Kuhlke, T. Sporkmann, D. Köther, R. Tempel, and I. Wolff, "A comprehensive evaluation of quasi-static 3D-FD calculations for more than 14 CPW structures-lines, disconitinuities and lumped elements", 1994 IEEE MTT-S Int. Symp., May 23-27, San Diego, USA, 1289-1292