Two-dimensional mapping of amplitude and phase of microwave fields inside a MMIC using the direct electro-optic sampling technique

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 1994, Pages 1597-1600

  Mertin, W ^a   Leyk, A ^a   David, G ^a   Bertenburg, R M ^a   Kosslowski, S ^a   Tegude, F J ^a   Wolff, I ^a   Jaeger, D ^a   Kubalek, E ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CONFORMAL MAPPING; ELECTRIC FIELDS; ELECTROOPTICAL EFFECTS; FAILURE ANALYSIS; LASER BEAMS; MONOLITHIC INTEGRATED CIRCUITS; NETWORK COMPONENTS; PHASE MEASUREMENT; SAMPLING; SUBSTRATES; VISUALIZATION;

DIRECT ELECTROOPTIC SAMPLING; TRAVELING WAVE AMPLIFIER;

MICROWAVE AMPLIFIERS;

EID: 0027929249     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)