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Volumn 148, Issue 9, 2001, Pages

Chlorine Plasma/Copper Reaction in a New Copper Dry Etching Process

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0013321147     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1392324     Document Type: Article
Times cited : (54)

References (13)
  • 10
    • 0442276301 scopus 로고    scopus 로고
    • G. S. Mathad, Editor, PV 99-30, The Electrochemical Society Proceedings Series, Pennington, NJ
    • Y. Kuo and S. Lee, in Plasma Etching Processes for Sub-quarter Micron Devices, G. S. Mathad, Editor, PV 99-30, p. 328, The Electrochemical Society Proceedings Series, Pennington, NJ (2000).
    • (2000) Plasma Etching Processes for Sub-quarter Micron Devices , pp. 328
    • Kuo, Y.1    Lee, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.