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Volumn 381, Issue 2-3, 1997, Pages
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Strain relaxation induced 1-dimensional and 0-dimensional structures: Bi on Ge(001)
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Author keywords
Bismuth; Germanium; Low index single crystal surfaces; Scanning tunneling microscopy; Surface stress; Surface structure, morphology, roughness and topography
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Indexed keywords
ANNEALING;
BISMUTH;
DEPOSITION;
MORPHOLOGY;
RELAXATION PROCESSES;
SCANNING TUNNELING MICROSCOPY;
SEMICONDUCTING GERMANIUM;
SEMICONDUCTOR GROWTH;
SURFACE TREATMENT;
STRAIN RELAXATION;
SURFACE STRUCTURE;
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EID: 0040687628
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(97)00055-1 Document Type: Article |
Times cited : (5)
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References (15)
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