Readout characteristics of a near-field optical probe as a data-storage readout device: Submicrometer scan height and resolution

Applied Optics

Volumn 38, Issue 5, 1999, Pages 863-868

  Yoshikawa, Hiroshi ^a   Ohkubo, Toshifumi ^a   Fukuzawa, Kenji ^a   Bouet, Laurence ^a,b   Yamamoto, Manabu ^a  

^a NTT CORPORATION   (Japan)

^b ATG   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012552911     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.38.000863     Document Type: Article

References (28)

1. H. J. Mamin and D. Rugar, “Thermomechanical writing with an atomic force microscope tip,” Appl. Phys. Lett. 61, 1003-1005 (1992).
2. H. J. Mamin, L. S. Fan, S. Hoen, and D. Rugar, “Tip-baseddata storage using micromechanical cantilevers,” Sensors Actuators 48, 215-219 (1995).
3. 2,” Appl. Phys. Lett. 71, 1-3 (1997).
4. T. Ohkubo, J. Kishigami, K. Yanagisawa, and R. Kaneko, “Submicron magnetizing and its detection based on the point magnetic recording concept,” IEEE Trans. Magn. 27, 5286-5288 (1991).
5. T. Ohkubo, J. Kishigami, K. Yanagisawa, and R. Kaneko, “Reduced-area magnetic bit recording and detection using magnetic force microscopy based on application of bidirectional magnetomotive force,” IEEE Trans. Magn. 29, 4086-4088 (1993).
6. D. Pohl, “Some thoughts about scanning probe microscopy, micromechanics, and storage,” IBM J. Res. Dev. 39, 701-711 (1995).
7. D. W. Pohl, W. Denk, and M. Lanz, “Optical stethoscopy: image recording with resolution X./20,” Appl. Phys. Lett. 44, 651-653 (1984).
8. U. Durig, D. W. Pohl, and F. Rohner, “Near-field optical-scanning microscopy,” J. Appl. Phys. 59, 3318-3327 (1986).
9. E. Betzig, J. K. Trautman, T. D. Harris, J. S. Weiner, and R. L. Kostealk, “Breaking the diffraction barrier: optical micros copy on a nanometric scale,” Science 251, 1468-1470 (1991).
10. E. Betzig, J. K. Trautman, R. Wolfe, E. M. Gyorgy, P. L. Finn, M. H. Kryder, and C. H. Chang, “Near-field magneto-optics and high density data storage,” Appl. Phys. Lett. 61, 142-144 (1992).
11. S. Hosaka, T. Shintani, M. Miyamoto, A. Hirotune, M. Terao, M. Yoshida, K. Fujita, and S. Kammer, “Nanometer-sized phase change recording using a scanning near-field optical microscope with a laser diode,” Jpn. J. Appl. Phys. 35,443-447 (1996).
12. D. W. Pohl and D. Couijoun, eds., Near-Field Optics, NATO Advanced Science Institutes Series E (Kluwer, Dordrecht, The Netherlands, 1993), Vol. 242.
13. M. Nieto-Vesperinas and N. Garcia, eds., Optics at the Nanometer Scale, NATO Advanced Science Institutes Series E (Kluwer, Dordrecht, The Netherlands, 1996), Vol. 319.
14. E. Betzig, P. L. Finn, and J. S. Weiner, “Combined shear force and near-field scanning optical microscopy,” Appl. Phys. Lett. 60, 2484-2486 (1992).
15. P. C. Yang, Y. Chen, and M. Vaez-Iravani, “Attractive-mode atomic force microscopy with optical detection in an orthogonal cantilever/sample configuration,” J. Appl. Phys. 71, 2499-2502 (1992).
16. R. Toledo-Crow, P. C. Yang, Y. Chen, and M. Vaez-Iravani, “Near-field differential scanning optical microscope with atomic force regulation,” Appl. Phys. Lett. 60, 2957-2959 (1992).
17. K. Liberman and A. Lewis, “Simultaneous scanning tunneling and optical near-field imaging with a micropipette,” Appl. Phys. Lett. 62, 1335-1337 (1993).
18. K. Fukuzawa, Y. Tanaka, S. Akamine, H. Kuwano, and H. Yamada, “Imaging of optical and topographical distributions by simultaneous near field scanning optical/atomic force microscopy with a microfabricated photocantilever,” J. Appl. Phys. 78, 7376-7381 (1995).
19. N. F. van Hulst, M. H. P. Moers, O. F. J. Noordham, R. G. Tack, F. B. Segerink, and B. Bolger, “Near-field optical microscope using a silicon-nitride probe,” Appl. Phys. Lett. 62, 461-463 (1993).
20. K. Kobayashi and O. Watanuki, “Characteristics of photon scanning tunneling microscope read-out,” J. Vac. Sci. Technol. B 14, 804-808 (1996).
21. A. Madrazo and M. Nieto-Vesperinas, “Model near-field calculations for optical data storage readout,” Appl. Phys. Lett. 70, 31-33 (1997).
22. S. Akamine, H. Yamada, and H. Kuwano, “Scanning near-field optical microscope using an atomic force microscope cantilever with integrated photodiode,” Appl. Phys. Lett. 68, 579-581 (1996).
23. J. W. Goodman, Introduction to Fourier Optics (McGraw-Hill, New York, 1968).
24. D. Van Labeke and D. Barchiesi, “Scanning-tunneling optical microscopy: a theoretical macroscopic approach,” J. Opt. Soc. Am. A 9, 732-739 (1992).
25. R. Petit, ed., Electromagnetic Theory of Gratings, Vol. 22 of Topics in Current Physics (Springer-Verlag, Berlin, 1980).
26. D. Maystre, “Rigorous vector theories of diffraction gratings,” in Progress in Optics XXI, E. Wolf, ed. (Elsevier, Amsterdam, 1984), pp. 1-67.
27. Y. Chen and R. K. Kupka, “Analysis of the near field image formation of dielectric gratings,” Ultramicroscopy 57, 153-159 (1995).
28. A. Yariv, Introduction to Optical Electronics, 3rd ed. (Holt, Rinehart & Winston, New York, 1985).