Scanning near-field optical microscope using an atomic force microscope cantilever with integrated photodiode

Applied Physics Letters

Volumn , Issue , 1995, Pages 579-

  Akamine, S ^a   Kuwano, H ^a   Yamada, H ^b  

^a NTT CORPORATION   (Japan)

^b NATL INST FOR ADV INTERDISC RES   (Japan)

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EID: 36449007253     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116504     Document Type: Article

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