X-ray diffraction investigations of structural changes in Co/Cu multilayers at elevated temperatures

Thin Solid Films

Volumn 411, Issue 2, 2002, Pages 234-239

  Hecker, M ^a   Pitschke, W ^a,b   Tietjen, D ^a   Schneider, C M ^a  

^a IFW DRESDEN   (Germany)

^b KLA TENCOR CORPORATION   (United States)

Author keywords

Coherent film growth; GMR effect; Multilayers; X ray diffraction; X ray reflectometry

Indexed keywords

COBALT; COPPER; CRYSTALLINE MATERIALS; FILM GROWTH; GIANT MAGNETORESISTANCE; RAPID THERMAL ANNEALING; X RAY DIFFRACTION ANALYSIS;

COHERENT FILM GROWTH; MASS STORAGE; X-RAY REFLECTOMETRY;

MULTILAYERS;

EID: 0012547185     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(02)00330-9     Document Type: Article

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