High resolution density of states spectroscopy in semiconductors by exact post-transit current analysis

Journal of Applied Physics

Volumn 88, Issue 2, 2000, Pages 1190-1192

  Main, C ^a   Reynolds, S ^a   Badran, R I ^b   Marshall, J M ^c  

^a UNIVERSITY OF ABERTAY DUNDEE   (United Kingdom)

^b HASHEMITE UNIVERSITY   (Jordan)

^c SWANSEA UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012202036     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.373797     Document Type: Article

References (10)

1. G. F. Seynhaeve, R. P. Barclay, G. J. Adriaenssens, and J. M. Marshall, Phys. Rev. B 39, 10196 (1989).
2. S. Usala, G. J. Adriaenssens, Ö. Öktu, and M. Nesladek, Appl. Surf. Sci. 50, 265 (1991).
3. B. J. Yan, D. X. Han, and G. J. Adriaenssens, J. Appl. Phys. 79, 3597 (1996).
4. A. Eliat, B. J. Yan, G. J. Adriaenssens, and J. Bezemer, J. Non-Cryst. Solids 200, 592 (1996).
5. A. Fejfar, G. Juska, and J. Kocka, J. Non-Cryst. Solids 200, 190 (1996).
6. F. Schauer, R. Handlir, and S. Nespurek, Adv. Mater. Opt. Electron. 7, 61 (1997).
7. J. M. Marshall, J. Non-Cryst. Solids 77/78, 425 (1983).
8. B. S. Garbow, K. E. Hillstrom, and J. J. More, Argonne National Laboratory MINPACK Project (1980).
9. C. Main, J. Berkin, and A. Merazga, in New Physical Problems in Electronic Materials, edited by M. Borissov, N. Kirov, J. M. Marshall, and A. Vavrek (World Scientific Press, Singapore, 1991), p. 55.
10. C. Main, in Amorphous and Microcrystalline Silicon Technology-1997, in Proceedings of MRS Symposium A, edited by M. Hack, E. A. Schiff, S. Wagner, A. Matsuda, and R. Schropp (Materials Research Society, Warrendale, PA, 1997), Chap. 143, p. 167.