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Volumn 1, Issue , 2001, Pages 105-113

A board level study of an array of ball grid components: Part I: Aerodynamic measurements

Author keywords

[No Author keywords available]

Indexed keywords

AERODYNAMICS; BOUNDARY LAYERS; COMPUTER SIMULATION; ELECTRONICS PACKAGING; HEAT RESISTANCE; PRINTED CIRCUIT BOARDS; THERMAL CONDUCTIVITY OF SOLIDS; VELOCITY MEASUREMENT;

EID: 0012072932     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (10)

References (18)
  • 3
    • 0012039953 scopus 로고    scopus 로고
    • Factors Affecting the Operational Thermal Resistance of Electronic Components
    • September
    • Davies, M.R.D., R. Cole, and J. Lohan, "Factors Affecting the Operational Thermal Resistance of Electronic Components," ASME Journal of Electronic Packaging, Vol. 122, Iss. 3, pp.185 - 191, September 2000
    • (2000) ASME Journal of Electronic Packaging , vol.122 , Issue.3 , pp. 185-191
    • Davies, M.R.D.1    Cole, R.2    Lohan, J.3
  • 7
    • 0347247657 scopus 로고    scopus 로고
    • Thermal Performance of the SuperBGA® Package
    • 25 January
    • Guenin, B.M., Molnar, R.J., and Marrs, R.C., "Thermal Performance of the SuperBGA® Package," presented at SEMICON Korea, 25 January 1996
    • (1996) SEMICON Korea
    • Guenin, B.M.1    Molnar, R.J.2    Marrs, R.C.3
  • 8
    • 0028404446 scopus 로고
    • The Thermal Wake Function for Rectangular Electronic Modules
    • March
    • Kang, S., 'The Thermal Wake Function for Rectangular Electronic Modules, ' ASME Journal of Electronic Packaging, Vol. 116, March, pp. 55-59, 1994
    • (1994) ASME Journal of Electronic Packaging , vol.116 , pp. 55-59
    • Kang, S.1
  • 9
    • 0025516755 scopus 로고
    • Applying Heat Transfer Coefficient Data to Electronics Cooling
    • Moffat, R. J., and Anderson, A. M., 'Applying Heat Transfer Coefficient Data to Electronics Cooling,' ASME Journal of Heat Transfer, Vol. 112, pp. 882-890, 1990
    • (1990) ASME Journal of Heat Transfer , vol.112 , pp. 882-890
    • Moffat, R.J.1    Anderson, A.M.2
  • 10
    • 0026836709 scopus 로고
    • The Adiabatic Heat Transfer Coefficient and the Superposition Kernel Function: Part 1 - Data for Arrays of Flatpacks for Different Flow Conditions
    • March
    • Anderson, A. M., and Moffat, R. J., "The Adiabatic Heat Transfer Coefficient and the Superposition Kernel Function: Part 1 - Data for Arrays of Flatpacks for Different Flow Conditions," ASME Journal of Electronic Packaging, Vol. 114, pp. 14-21, March 1992
    • (1992) ASME Journal of Electronic Packaging , vol.114 , pp. 14-21
    • Anderson, A.M.1    Moffat, R.J.2
  • 11
    • 0347830974 scopus 로고    scopus 로고
    • Survey of Forced Convection Correlations for Cooling of Electronic Components Mounted on Printed Circuit Boards
    • Albuquerque, USA, August 15-17
    • King, D.E., and Wright, N.T., "Survey of Forced Convection Correlations for Cooling of Electronic Components Mounted on Printed Circuit Boards," Proceedings of the 33rd National Heat Transfer Conference, Paper 137, Albuquerque, USA, August 15-17, 1999
    • (1999) Proceedings of the 33rd National Heat Transfer Conference, Paper 137
    • King, D.E.1    Wright, N.T.2
  • 14
    • 0347830971 scopus 로고    scopus 로고
    • Low Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
    • JEDEC International Standards, EIA/JESD51-3, Eng. Dept.
    • JEDEC International Standards, EIA/JESD51-3 "Low Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages," Electronic Industries Alliance, Eng. Dept.
    • Electronic Industries Alliance
  • 15
    • 0003388370 scopus 로고    scopus 로고
    • G42-0996 Test Method - Thermal Test Board Standardisation for Measuring Junction-to-Ambient Thermal Resistance of Semiconductor Packages
    • SEMI International Standards
    • SEMI International Standards, "G42-0996 Test Method - Thermal Test Board Standardisation for Measuring Junction-to-Ambient Thermal Resistance of Semiconductor Packages," Packaging Volume, pp. 195-200, 1996
    • (1996) Packaging Volume , pp. 195-200
  • 17
    • 0001370473 scopus 로고    scopus 로고
    • Still-air Junction-to-ambient Thermal Resistances of Different Devices as Functions of the Effective Conductivity of Printed Circuit boards
    • Thermal Management of Electronic Systems III, Nantes, France, September
    • Punch, J. and Davies, M.R.D., 'Still-air Junction-to-ambient Thermal Resistances of Different Devices as Functions of the Effective Conductivity of Printed Circuit boards,' EUROTHERM Seminar No. 58, Thermal Management of Electronic Systems III, pp. 262-268, Nantes, France, September 1997
    • (1997) EUROTHERM Seminar No. 58 , vol.58 , pp. 262-268
    • Punch, J.1    Davies, M.R.D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.