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Volumn 97-98, Issue , 2002, Pages 434-440

Strength and leak testing of plasma activated bonded interfaces

Author keywords

Bond strength; Hermeticity; Oxygen plasma; PAB; Water bonding

Indexed keywords

ACETONE; BOND STRENGTH (MATERIALS); CLEANING; FRACTURE; INTERFACES (MATERIALS); INTERFACIAL ENERGY; OXYGEN; PLASMA APPLICATIONS; SILICA; SOLDERING; VACUUM APPLICATIONS; WATER;

EID: 0011868622     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-4247(02)00047-X     Document Type: Conference Paper
Times cited : (22)

References (17)
  • 13
    • 0003656907 scopus 로고    scopus 로고
    • Silicon to silicon wafer bonding for microsystem packaging and formation
    • Ph.D. Thesis, Technical University of Denmark
    • (2000)
    • Weichel, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.