Excess noise caused by transverse inhomogeneity of conductive channels

Applied Physics Letters

Volumn 73, Issue 2, 1998, Pages 217-219

  Bulashenko, O M ^a   Rubi J M ^a   Kochelap, V A ^b,c  

^a UNIVERSITY OF BARCELONA   (Spain)

^b UNIVERSIDAD CARLOS III DE MADRID   (Spain)

^c INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0011416009     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121760     Document Type: Review

References (12)

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10. ω, and results in the trivial Nyquist thermal noise. Here we are interested only in the excess noise spectrum and omit the thermal noise contribution.
11. C. M. Bender and S. A. Orszag, Advanced Mathematical Methods for Scientists and Engineers (McGraw-Hill, New York, 1978), Chap. 10.
12. K. Lee, M. S. Shur, K. Lee, T. T. Vu, P. C. T. Roberts, and M. J. Helix, IEEE Trans. Electron Devices 31, 390 (1984).