Orange-green emission from porous Si coated with Ge films: The role of Ge-related defects

Journal of Applied Physics

Volumn 86, Issue 1, 1999, Pages 707-709

  Wu, X L ^a   Gu, Y ^a   Siu, G G ^b   Fu, Eric ^b   Tang, N ^a   Gao, T ^a   Bao, X M ^a  

^a NANJING UNIVERSITY   (China)

^b CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0009971011     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.370790     Document Type: Article

References (24)

1. Y. Maeda, N. Tsukamoto, Y. Yazawa, Y. Kanemits, and Y. Matsumoto, Appl. Phys. Lett 59, 3168 (1991); Y. Maeda, Phys. Rev. B 51, 1658 (1995).
2. Y. Maeda, N. Tsukamoto, Y. Yazawa, Y. Kanemits, and Y. Matsumoto, Appl. Phys. Lett 59, 3168 (1991); Y. Maeda, Phys. Rev. B 51, 1658 (1995).
3. Y. Kanemitsu, H. Uto, and Y. Masumoto, Appl. Phys. Lett. 61, 2187 (1992).
4. K. S. Min, K. V. Shcheglov, C. M. Yang, H. A. Atwater, M. L. Brongersma, and A. Polman, Appl. Phys. Lett. 68, 2511 (1996).
5. D. C. Paine, C. Caragianis, and Y. Shigesato, Appl. Phys. Lett. 60, 2286 (1992); D. C. Paine, C. Caragianis, T. Y. Kiim, and Y. Shigesato, Appl. Phys. Lett. 62, 2842 (1993).
6. D. C. Paine, C. Caragianis, and Y. Shigesato, Appl. Phys. Lett. 60, 2286 (1992); D. C. Paine, C. Caragianis, T. Y. Kiim, and Y. Shigesato, Appl. Phys. Lett. 62, 2842 (1993).
7. M. Zacharias and F. P. Fauchet, Appl. Phys. Lett. 71, 380 (1997); M. Zacharias, J. Biasing, M. Lohmann, and J. Christen, Thin Solid Films 278, 32 (1996).
8. M. Zacharias and F. P. Fauchet, Appl. Phys. Lett. 71, 380 (1997); M. Zacharias, J. Biasing, M. Lohmann, and J. Christen, Thin Solid Films 278, 32 (1996).
9. T. Gao, S. Tong, X. Q. Zheng, X. L. Wu, L. M. Wang, and X. M. Bao, Appl. Phys. Lett. 72, 3312 (1998).
10. T. Gao, X. M. Bao, F. Yan, and S. Tong, Phys. Lett. A 232, 321 (1997).
11. X. L. Wu, T. Gao, X. M. Bao, F. Yan, S. S. Jiang, and D. Feng, J. Appl. Phys. 82, 2704 (1997).
12. P. D. Persans, A. F. Rupper, B. Abeles, and T. Tiedje, Phys. Rev. B 32, 5558 (1985); H. H. Burke and I. P. Herman, Phys. Rev. B. 48, 15016 (1993).
13. P. D. Persans, A. F. Rupper, B. Abeles, and T. Tiedje, Phys. Rev. B 32, 5558 (1985); H. H. Burke and I. P. Herman, Phys. Rev. B. 48, 15016 (1993).
14. M. I. Alonso and K. Winer, Phys. Rev. B 39, 10056 (1989).
15. P. A. Temple and C. E. Hathaway, Phys. Rev. B 7, 3685 (1973).
16. Y. Saito, J. Cryst. Growth 47, 61 (1979).
17. S. Hayashi and H. Abe, Jpn. J. Appl. Phys., Part 2 23, L824 (1984).
18. B. D. Cullity, Elements of X-ray Diffraction (Addison-Wesley, London, 1959), p. 261.
19. H. Z. Song and X. M. Bao, Phys. Rev. B 55, 6988 (1997).
20. L. Tsybeskov, Ju. V. Vandyshev, and P. M. Fanchet, Phys. Rev. B 49, 7821 (1994).
21. M. Gallagher and U. Osterberg, J. Appl. Phys. 74, 2771 (1993).
22. T. E. Tsai, D. L. Griscom, and E. J. Friebele, Diffus. Defect Data 53/54, 469 (1987).
23. M. Kohketsu, K. Awazu, H. Kawazoe, and M. Yamane, Jpn. J. Appl. Phys. 28, 622 (1989); K. Awazu, K. Muta, and H. Kawazoe, J. Appl. Phys. 74, 121 (1993).
24. M. Kohketsu, K. Awazu, H. Kawazoe, and M. Yamane, Jpn. J. Appl. Phys. 28, 622 (1989); K. Awazu, K. Muta, and H. Kawazoe, J. Appl. Phys. 74, 121 (1993).