Nanofabrication of Self-assembled Molecular-scale Electronics

Journal of Low Temperature Physics

Volumn 118, Issue 5-6, 2000, Pages 343-353

  Olofsson, Linda G M ^a   Persson, S H Magnus ^a   Morpurgo, Alberto ^b   Marcus, Charles M ^b   Golubev, Dimitri ^a   Gunnarsson, Linda K ^a   Yao, Yimin ^a  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^b STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0008531775     PISSN: 00222291     EISSN: None     Source Type: Journal    
DOI: 10.1023/a:1004637932760     Document Type: Article

References (15)

1. See references in Single Charge Tunneling, Eds. H. Grabert and M Devoret. NATO ASI, series B 294, (Plenum, New York, 1994)
2. S. H. M. Persson, L. Olofsson, L. Hedberg, D. Sutherland And E. Olsson, Annals of New York Acad. Sci, vol. 852, pp. 188 (1998).
3. D. L. Klein, R. Roth, A. K. L. Lim, A. P. Alivisatos, P. L. McEuen, Nature, 389, pp. 699 (1997)
4. A. Berzryadin, C. Dekker and G. Schmid, Appl. Phys. Lett. 71, pp. 1273 (1997).
5. T. Sato, H. Ahmed, D. Brown and B. F. G. Johnson, J. Appl. Phys, 82, pp. 801 (1994)
6. A.F. Morpurgo, C.M. Marcus, D.B. Robinson, Appl. Phys. Lett, 74, pp. 2084 (1999)
7. M. Brust, M.L Walker, D. Bethell, D. J. Schriffin and R. Whyman, J. Chem.Soc.,Chem. Commun., pp. 801 (1994)
8. S.H.M. Persson, L. Olofsson and L. Gunnarsson, Appl. Phys. Lett., 74, 17, pp. 2546 (1999)
9. D. V. Leff, P. C. Ohara, J. R. Heath and W. M. Gelbart, J. Phys. Chem., 99, pp. 7036 (1995)
10. R. L. Whetten et al., Advanced Materials, 8, pp. 428 (1996) .
11. L.Y. Gorelik A. Isacsson M. V. Voinova B. Kasemo R. I. Shekhter and M. Jonson, Phys. Rev. Lett, 80, pp. 4526 (1998).
12. C. Schönenberger, J.A.M Sondag-Huethorst, J. Jorritsma, and L.G.J. Fokkink, Langmuir, 10, pp 611 (1994)
13. M. H. Devoret, D. Esteve, H. Grabert, G-L. Ingold, H. Porthier, and C. Urbina, Phys. Rev. Lett., 64, pp. 1824 (1990)
14. D. S. Golubev, J. König, H. Schoeller, G. Schön, A. D. Zaikin, Phys. Rev. B, 56, pp. 15782 (1997)
15. -18F and an estimation of the distance between the electrodes, a ≈ 1.3 nm.