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Journal of Applied Physics

Volumn 75, Issue 12, 1994, Pages 7799-7804

Computer simulation of electromigration in thin-film metal conductors

(3) Trattles, J T a O'Neill, A G a Mecrow, B C a

a NEWCASTLE UNIVERSITY (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0008457212 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.356586 Document Type: Article

Times cited : (27)

References (32)

1
- 49749201891
- (1961) J. Phys. Chem. Solids , vol.20 , pp. 76
- Huntington, H.B.¹ Grone, A.R.²

2
- 0001976760
- (1959) Sov. Phys. Solid State , vol.1 , pp. 14
- Fiks, V.B.¹

3
- 0000820760
- (USAF, Rome Air Development Center, 1967)
- Physics of Failure in Electronics , vol.5 , pp. 496-505
- Blech, I.A.¹ Shilliday, T.S.² Vaccaro, J.³ Sello, H.⁴

4
- 1842617942
- (1989) Rep. Prog. Phys , vol.52 , pp. 301
- Ho, P.S.¹ Kwok, T.²

5
- 0016940795
- (1976) J. Appl. Phys , vol.47 , pp. 1203
- Blech, I.A.¹

6
- 21944443314
- (1977) J. Appl. Phys(E) , vol.48 , pp. 2648
- Blech, I.A.¹

7
- 0003354983
- (1991) J. Appl. Phys , vol.70 , pp. 172
- Kirchheim, R.¹ Kaeber, U.²

8
- 0008519971
- (1991) J. Appl. Phys , vol.70 , pp. 1359
- Huntington, H.B.¹ Kalukin, A.² Meng, P.P.³ Shy, Y.T.⁴ Ahmad, S.⁵

9
- 0020135743
- (1982) Thin Solid Films , vol.91 , pp. 175
- Lloyd, J.R.¹

10
- 0015142191
- (1971) J. Appl. Phys , vol.42 , pp. 4343
- Attardo, M.J.¹ Rutledge, R.² Jack, R.C.³

11
- 0019660825
- in Proceedings of the 19th IEEE International Reliability Physics Symposium (IRPS), 1981
- Nikawa, K.¹

12
- 0024123630
- (1988) IEEE Trans. Electron Devices , vol.35 , pp. 2170
- Harrison, J.W.¹

13
- 0026745811
- (1991) Microelectron. Reliab , vol.32 , pp. 21
- Scherge, M.¹ Breternitz, V.² Knedlik, C.³

14
- 0022566257
- in Proceedings of the IEEE VLSI Multilevel Interconnection Conference (V-MIC), 1986
- Walter, M.J.¹

15
- 84951892814
- June
- (1989) Hewlett-Packard J , vol.79
- Marcoux, P.J.¹ Merchant, P.P.² Narodisky, V.³ Rehder, W.D.⁴

16
- 0342515514
- (1993) J. Appl. Phys , vol.73 , pp. 2821
- Smy, T.J.¹ Winterton, S.S.² Brett, M.J.³

17
- 0001715365
- (1954) Acta Metall , vol.2 , pp. 419
- Turnbull, D.¹ Hoffmann, R.E.²

18
- 36849141497
- (1961) J. Appl. Phys , vol.32 , pp. 525
- Li, J.C.M.¹

19
- 84937650904
- (1969) IEEE Trans. Electron Devices , vol.16 , pp. 338
- Black, J.R.¹

20
- 0014630193
- (1969) Proc. IEEE , vol.57 , pp. 1587
- Black, J.R.¹

21
- 0000204618
- (1968) Appl. Phys. Lett , vol.12 , pp. 201
- Rosenberg, R.¹ Berenbaum, L.²

22
- 0027628195
- (1993) IEEE Trans. Electron Devices , vol.40 , pp. 1344
- Trattles, J.T.¹ O’Neill, A.G.² Mecrow, B.C.³

23
- 84951897902
- Ph.D. thesis, University of Newcastle upon Tyne, 1993
- Trattles, J.T.¹

24
- 0026185685
- (1991) Solid-State Electron , vol.34 , pp. 741
- Milnes, A.G.¹ Bauer, C.L.²

25
- 85045826824
- (1992) Solid-State Electron(C) , vol.35 , pp. 1201
- Milnes, A.G.¹ Bauer, C.L.²

26
- 0022199371
- in Proceedings of the 23rd IEEE International Reliability Physics Symposium (IRPS), 1985
- Yue, J.T.¹ Funsten, W.P.² Taylor, R.V.³

27
- 21544482636
- (1992) J. Appl. Phys , vol.72 , pp. 1821
- Li, Z.¹ Bauer, C.L.² Mahajan, S.³ Milnes, A.G.⁴

28
- 0023855692
- in Proceedings of the 26th IEEE International Reliability Physics Symposium (IRPS), 1988
- Maiz, J.A.¹ Segura, I.²

29
- 84951891853
- (MRS, Pittsburgh, PA, 1992)
- Material Research Society Symposium Proceedings:Materials Reliability Issues in Microelectronics , vol.265 , pp. 83-94
- Greer, A.L.¹ Shih, W.C.²

30
- 84951891576
- Material Research Society Symposium Proceedings:Materials Reliability Issues in Microelectronics
- (MRS, Pittsburgh, PA, 1991), C.-K. Hu, P. S. Ho, M. B. Small, and K. Kelleher, in
- , vol.225 , pp. 99-105

31
- 0022207691
- C.-Y. Kao, in Proceedings of the 23rd IEEE International Reliability Physics Symposium (IRPS), 1985
- Schafft, H.A.¹ Grant, T.C.² Saxena, A.N.³

32
- 0039709987
- Materials Reliability Issues in Microelectronics (MRS, Pittsburgh, PA, 1992)
- Material Research Society Symposium Proceedings , vol.265 , pp. 101-106
- Shih, W.C.¹ Denton, T.C.² Greer, A.L.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.