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Volumn 7, Issue 2, 2000, Pages 68-76

Laser removal of oxides and particles from copper surfaces for microelectronic fabrication

Author keywords

[No Author keywords available]

Indexed keywords

ABRASIVES; ACOUSTICS; COPPER; LASER BEAM EFFECTS; LASERS; MONITORING; OXIDES; PRINTED CIRCUIT BOARDS; Q SWITCHED LASERS; SURFACE CLEANING;

EID: 0008366462     PISSN: 10944087     EISSN: None     Source Type: Journal    
DOI: 10.1364/OE.7.000068     Document Type: Article
Times cited : (54)

References (16)
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    • Laser cleaning for electronic device fabrication
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    • J. M. Lee, K. G. Watkins, "Laser cleaning for electronic device fabrication," The Industrial Laser User, Issue 18, pp. 29-30 (Feb. 2000).
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    • Lee, J.M.1    Watkins, K.G.2
  • 9
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    • Real-time surface monitoring in the laser cleaning of copper for soldering processes
    • J. M. Lee, K. G. Watkins, "Real-time surface monitoring in the laser cleaning of copper for soldering processes," Lasers in Eng. 8 (3), 229-239 (1999).
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  • 10
    • 17344392783 scopus 로고    scopus 로고
    • Laser removal of oxides from a copper substrate using Q-switched Nd:YAG radiation at 1064 nm, 532 nm and 266 nm
    • A. Kearns, C. Fischer, K. G. Watkins et al, "Laser removal of oxides from a copper substrate using Q-switched Nd:YAG radiation at 1064 nm, 532 nm and 266 nm," Appl. Surf. Sci. 127-129, 773-780 (1998).
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.